Contingency Space: A Semimetric Space for Classification Evaluation
Published in IEEE Transactions on Pattern Analysis and Machine Intelligence, 2023
Recommended citation: A. Ahmadzadeh, D.J. Kempton, P.C. Martens, R.A. Angryk, "Contingency Space: A Semimetric Space for Classification Evaluation," IEEE Transactions on Pattern Analysis and Machine Intelligence, Vol. 45(2), 2023, IEEE, pp. 1501-1513.
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